Image Sensor Characterization System

Image Sensor Characterization System

Image Sensor Characterization System

Item Number: MV-IS

Description: MV-IS is a high-performance measurement system of CCD/CMOS image sensor and camera systems for a variety of applications. The measurement wavelength can be extendable to 300 nm~1100 nm. Enlitech’s patent uniform light system provides a greater intensity than a traditional integrating sphere. Besides, the unique design for monochromator light, which enables the wavelength resolution to be up to 0.1nm and make the mesurement more accurate.


Optional Features

Features

  • Exclusive uniform light system and high monochromatic light intensity
  • Full array pixel measurement
  • Divergence angle < 5°
  • Multiple camera interface 
  • Is capable of hardware expansion and system upgrade
  • Laser positioning 

Application

  • CCD camera
  • CMOS camera
  • UV sensor
  • Infrared light sensor
  • Camera
  • Other optoelectronic devices

Integration Solutions
The system provides the solutions for the photon transfer method measurement:

  • Quantum Efficiency/Spectral Response
  • Sensibility
  • Dynamic Range 
  • Dark Current /noise 
  • Linearity Error LE
  • Dark current non-uniformity 
  • Photo response non-uniformity
  • Chief Ray Angle, CRA
The measurement results for the industrial camera @ 470 nm wavelength.

The measurement results for the industrial camera @ 470 nm wavelength.

 
Optional Features

Optional Features