Reflectivity Mapper

Reflectivity Mapper

Reflectivity Mapper

Item Number: Reflectivity Mapper

Features:

  • Sample surface D8 reflectance spectrum measurement
  • Wavelength Range : 300 nm ~ 1100 nm
  • Rapid auto-mapping function
  • Can scan entire reflectance spectrum and mapping analysis for different wavelengths
  • 3D mapping display
  • Wide application: For cells / OLED / optical coating 
  • Options: Transmittance and film thickness measurement 
  • Customized mapping size