Reflectivity Mapper
Reflectivity Mapper
Item Number: Reflectivity Mapper
Features:
- Sample surface D8 reflectance spectrum measurement
- Wavelength Range : 300 nm ~ 1100 nm
- Rapid auto-mapping function
- Can scan entire reflectance spectrum and mapping analysis for different wavelengths
- 3D mapping display
- Wide application: For cells / OLED / optical coating
- Options: Transmittance and film thickness measurement
- Customized mapping size