Reflectivity Mapper

Item Number: Reflectivity Mapper

Features:

Sample surface D8 reflectance spectrum measurement
Wavelength Range : 300 nm ~ 1100 nm
Rapid auto-mapping function
Can scan entire reflectance spectrum and mapping analysis for different wavelengths
3D mapping display
Wide application: For cells / OLED / optical coating
Options: Transmittance and film thickness measurement
Customized mapping size